英语语法分析

The sensitivity for the semiconductor minority carrier lifetime measurement system was determined using microwave photoconductance decay.

对微波光电导法测量半导体少数载流子寿命的测试系统进行灵敏度分析。

The characterization of SiN thin films was studied by spectral ellipsometry, reflection spectra, infrared absorption spectroscopy (IR) and quasi-steady state photoconductance (QSSPC) measurements.

利用椭圆偏振光谱、反射谱、红外吸收谱和准稳态光电导（QSSPC）分析了氮化硅薄膜的特性。